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Universal SOIC ZIF Test Socket

  • Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket.
  • Accepts SOIC Gull-wing and J-Pb devices, up to 44 pins on 0.050 [1.27] Pb pitch, body widths from 0.150 to 0.600 [3.81 to 15.24].
  • Optional device lifter for easy package removal.
GENERAL SPECIFICATIONS
  • BODY MATERIAL: black UL 94V-0 glass-filled Polyphenylene Sulfide (PPS)
  • CONTACTS: BeCu 172 per QQ-C-533
  • CONTACT PLATING: 20µ [0.51µ] min. Au per MIL-G-45204 over 100µ [2.54µ] min. Ni per QQ-N-290 over 20µ [0.51µ] min. Cu per MIL-C-14550
  • HARDWARE: Stainless Steel
  • CONTACT CURRENT RATING: 1 amp
  • OPERATING TEMPERATURE: 257°F [125°C]
547 Series Test Socket
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